Interface Trapping Effects of a MOSCAP
Application ID: 67121
This tutorial compares experimental data from the literature with a COMSOL model of a MOSCAP with interface traps (surface states). The Trap-Assisted Surface Recombination feature is used to simulate the effects of the trap charges and the processes of carrier capturing and emitting by the traps. The effect of the fixed charges in the gate oxide is also included. The computed values of the capacitance and conductance as functions of the gate voltage and frequency reproduce the qualitative behavior of the experimental data with comparable magnitudes. The model uses the quasi-Fermi level formulation and shows how to plot quantities such as the trap occupancy as a function of the energy.
This model example illustrates applications of this type that would nominally be built using the following products:
however, additional products may be required to completely define and model it. Furthermore, this example may also be defined and modeled using components from the following product combinations:
The combination of COMSOL® products required to model your application depends on several factors and may include boundary conditions, material properties, physics interfaces, and part libraries. Particular functionality may be common to several products. To determine the right combination of products for your modeling needs, review the Спецификация and make use of a free evaluation license. The COMSOL Sales and Support teams are available for answering any questions you may have regarding this.